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Beilstein J. Nanotechnol. 2013, 4, 336–344, doi:10.3762/bjnano.4.39
Figure 1: Schematic drawing of used membranes with 100 μm thick Si grid and a 40 nm layer of electron-transpa...
Figure 2: SEM pictures of irradiated CSPETCS layer on a Si/SiO2 substrate (100 μm/40 nm) after incubation wit...
Figure 3: SEM-T micrographs of CSPETCS silanised SiO2 TEM windows after irradiation and incubation with a sol...
Figure 4: Height (a,c,d) and phase (b) measurements via AFM of an irradiated CSPETCS monolayer incubated with...
Figure 5: Super structure of immobilised 6 nm AuNPs on a circular structure written by CEBL (a) and possible ...
Figure 6: AFM height measurement of a superstructured AuNP pattern (a), exemplary height profile (b) of line ...
Figure 7: AFM measurements of height (a, b) and phase (c) of a CSPETCS SAM patterned by pointwise irradiation...
Figure 8: Horizontal (a) and vertical (b) spatial autocorrelation of AFM height measurement in Figure 7b and histogram...